日期:2012-07-20 16:25
标准编号: IEC 60749-11-2002
中文标准名称: 半导体器件.机械和气候试验方法.第11部分: 温度的急速变化.双液电镀槽法
代替标准号: IEC 47/1535A/CDV-2000;IEC 47/1605/FDIS-2002;IEC 60749-1996;IEC 60749 AMD 1-2000;IEC 60749 AMD 2-2001;IEC 60749 Edition 2.2-2002;IEC/PAS 62185-2000,
标准简介:
defines the rapid change of temperature test method and the two-fluid-bath method. this test method may also be used, employing fewer cycles, to test the effect of immersion in heated liquids